发明名称 Vapor drying for cleaning photoresists
摘要 One aspect of the present invention relates to a method of cleaning a patterned photoresist clad structure involving the steps of contacting the patterned photoresist clad structure with an alcohol vapor comprising at least one compound having the Formula ROH, wherein R is a hydrocarbon group comprising from 4 to about 8 carbon atoms; condensing the alcohol vapor on the patterned photoresist clad structure; and removing the condensed alcohol vapor from the patterned photoresist clad structure. Another aspect of the present invention involves the use of an alcohol vapor having a boiling point from about 102° C. to about 175° C. Yet another aspect of the present invention involves the use of an alcohol vapor having a flash point from about 15° C. to about 80° C.
申请公布号 US6663723(B1) 申请公布日期 2003.12.16
申请号 US20010974276 申请日期 2001.10.10
申请人 ADVANCED MICRO DEVICES, INC. 发明人 TEMPLETON MICHAEL K.;SUBRAMANIAN RAMKUMAR;PHAN KHOI A.;RANGARAJAN BHARATH
分类号 B08B7/00;G03F7/40;(IPC1-7):B08B5/00 主分类号 B08B7/00
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