发明名称 Semiconductor memory device having self-aligned wiring conductor
摘要 According to the present invention, an overlay margin is secured for matching a wiring electrode 11 with a storage electrode 15 of a capacitor at their point of contact and the required area for a memory cell can be decreased by placing the plug electrode 11 of titanium nitride in the active region of a semiconductor substrate or over the gate electrode, reducing the size of the opening for passing the storage electrode 15 of the capacitor of a stacked structure, and decreasing the line width of a wiring electrode 13. By the common use of the above-mentioned plug electrodes in a CMISFET region in the peripheral circuit and in a memory cell of a static RAM, their circuit layouts can be made compact.
申请公布号 US6661048(B2) 申请公布日期 2003.12.09
申请号 US20010825921 申请日期 2001.04.05
申请人 HITACHI, LTD. 发明人 YAMANAKA TOSHIAKI;KIMURA SHIN'ICHIRO;MATSUOKA HIDEYUKI;SEKIGUCHI TOMONORI;SAKATA TAKESHI;ITOH KIYOO
分类号 H01L21/02;H01L21/3205;H01L21/3213;H01L21/768;H01L21/8242;H01L23/535;H01L27/108;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119 主分类号 H01L21/02
代理机构 代理人
主权项
地址