发明名称 ALIGNER AND EXPOSURE METHOD
摘要 PROBLEM TO BE SOLVED: To offer an aligner and an exposure method which can continuously change or adjust the image focus location and image surface of a projection optical system with high accuracy to perform accurate exposure processing. SOLUTION: This scanning aligner EX synchronously moves a mask M lit by exposure light and a photosensitive substrate P, while projecting and exposing the pattern image of the mask M on the photosensitive substrate P via projection optical systems PL1 through PL5. The equipment is provided with an image surface adjustment unit 10 which adjusts the position of the pattern image surface in the Z-axis direction along the light path of exposure light, and at the same time, adjusts the inclination of the pattern image surface. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003309053(A) 申请公布日期 2003.10.31
申请号 JP20020110906 申请日期 2002.04.12
申请人 NIKON CORP 发明人 SHIRATO AKIHITO;SHIRASU HIROSHI;KATO MASANORI
分类号 G03F7/22;G03F9/00;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/22
代理机构 代理人
主权项
地址