发明名称 CCD wafers with titanium refractory metal
摘要 In order to make a charge couple device including an interconnect layer to contact active areas, a first layer of a first titanium nitride layer on the active areas, and then a series of alternating titanium and titanium nitride layers are deposited to form a composite sandwich structure. This structure is less prone flaking while able to withstand high temperature treatment during fabrication of backside illuminated sensors to improve quantum efficiency and reduce dark current.
申请公布号 US2003197209(A1) 申请公布日期 2003.10.23
申请号 US20030435043 申请日期 2003.05.12
申请人 GROULX ROBERT;FROST RAYMOND;TREMBLAY YVES 发明人 GROULX ROBERT;FROST RAYMOND;TREMBLAY YVES
分类号 H01L21/3205;H01L21/768;H01L23/532;H01L27/148;H01L31/0264;H01L31/18;(IPC1-7):H01L23/48;H01L29/40 主分类号 H01L21/3205
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