发明名称 HEAT CUTOFF COMPONENT AND ELECTRON BEAM EXPOSURE APPARATUS HAVING HEAT CUTOFF COMPONENT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a heat cutoff component capable of preventing the thermal deformation of a table located in a vacuum chamber and an electron beam exposure apparatus having the heat cutoff component. <P>SOLUTION: A mirror 70 is positioned between a wafer table 40 disposed in the vacuum chamber and a printed board 50 attached to the wafer table 40 to reflect heat radiated from the printed board 50 in a direction opposite to the wafer table 40, thereby, the wafer table 40 is insulated from the printed board 50 thermally. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2003297719(A) 申请公布日期 2003.10.17
申请号 JP20020093680 申请日期 2002.03.29
申请人 NIKON CORP 发明人 SHIMAMURA NAOTAKA
分类号 G03F7/20;H01J37/20;H01J37/305;H01L21/027;H01L21/68;(IPC1-7):H01L21/027 主分类号 G03F7/20
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