发明名称 APPEARANCE-INSPECTING METHOD AND APPARATUS THEREOF
摘要 PROBLEM TO BE SOLVED: To provide an appearance-inspecting method and an appearance-inspecting apparatus that can normally inspect a location that should be inspected and discriminated and at the same time has a wide visual field range of an optical system and a side photographing range. SOLUTION: The appearance-inspecting apparatus and method comprise an inspection target 2, a photographing means 4 for transmitting the photograph image of the inspection target 2 as image data, and an image-processing apparatus 5 having a function for analyzing image data from the photographing means 4 for judging whether the appearance of the inspection target 2 conforms or not, thus inspecting the appearance of the inspection target 2 by the conformance judgment by the image-processing apparatus 5. The optical system to the inspection target 2 is set to be an optical system 7 that has a high magnification and a large numerical aperture, and the image of the inspection target 2 from the optical system 7 is photographed by the photographing means 4 through an optical system 8 having a reduced magnification. As a result, fine projections and recesses 10 of the inspection target 2 are imaged to a bright image having a small shading difference, and an inspection region 12 is imaged to an image having a large shading difference, thus performing accurate conformance judgment and expanding a photographing range. COPYRIGHT: (C)2004,JPO
申请公布号 JP2003294640(A) 申请公布日期 2003.10.15
申请号 JP20020102943 申请日期 2002.04.04
申请人 SEIKO EPSON CORP 发明人 SHINPO TOSHINAO;FUJIMORI TOSHIKI
分类号 B41J2/16;G01B11/24;G01N21/84;(IPC1-7):G01N21/84 主分类号 B41J2/16
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