发明名称 Memory cell with a vertical transistor and fabrication method thereof
摘要 A memory cell with a vertical transistor has a semiconductor silicon substrate with a deep trench, in which the deep trench has a first sidewall region and a second sidewall region. A first insulating layer is formed overlying the first sidewall region. A second insulating layer is formed overlying the second sidewall region, in which the thickness of the first insulating layer is larger than the thickness of the second insulating layer. A gate electrode layer is sandwiched between the first insulating layer and the second insulating layer. A buried strap out-diffusion region is formed in the substrate adjacent to the second sidewall region, in which the buried strap out-diffusion region is located near the lower portion of the second insulating layer.
申请公布号 US2005167721(A1) 申请公布日期 2005.08.04
申请号 US20040845909 申请日期 2004.05.14
申请人 NANYA TECHNOLOGY CORPORATION 发明人 LIN SHIAN-JYH;HSU YU-SHENG
分类号 H01L21/334;H01L21/76;H01L21/8242;H01L27/108;H01L29/732;(IPC1-7):H01L21/824 主分类号 H01L21/334
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