发明名称 |
TECHNIQUES FOR PLASMA ETCHING SILICON-GERMANIUM |
摘要 |
The present invention provides novel etching techniques for etching Si-Ge, employing SF6/fluorocarbon etch chemistries at a low bias power. These plasma conditions are highly selective to organic photoresist. The techniques of the present invention are suitable for fabricating optically smooth Si-Ge surfaces. A cavity was etched in a layer of a first Si-Ge composition using SF6/C4F8 etch chemistry at low bias power. The cavity was then filled with a second Si-Ge composition having a higher refractive index than the first Si-Ge composition. A waveguide was subsequently fabricated by depositing a cladding layer on the second Si-Ge composition that was formed in the cavity. In a further embodiment a cluster tool is employed for executing processing steps of the present invention inside the vacuum environment of the cluster tool. In an additional embodiment a manufacturing system is provided for fabricating waveguides of the present invention. The manufacturing system includes a controller that is adapted for interacting with a plurality of fabricating stations.
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申请公布号 |
US2003176075(A1) |
申请公布日期 |
2003.09.18 |
申请号 |
US20020093050 |
申请日期 |
2002.03.06 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
KHAN ANISUL;KUMAR AJAY;NALLAN PADMAPANI |
分类号 |
G02B6/136;H01L21/3065;(IPC1-7):H01L21/476 |
主分类号 |
G02B6/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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