发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to shorten process time and to reduce process temperature by using ion-implantation instead of polysilicon doping. CONSTITUTION: A gate oxide layer(2) is formed on a semiconductor substrate(1). A SixNyOz layer(3) is formed by nitridation processing of the gate oxide layer, and a polysilicon layer(4) is continuously deposited on the resultant structure. Desired dopants are implanted into the polysilicon layer. Oxidation or annealing process is performed to stabilize and activate the dopants.
申请公布号 KR100399957(B1) 申请公布日期 2003.09.18
申请号 KR19960018366 申请日期 1996.05.28
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHOI, BYEONG DAE;KIM, UI SIK
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址