发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to shorten process time and to reduce process temperature by using ion-implantation instead of polysilicon doping. CONSTITUTION: A gate oxide layer(2) is formed on a semiconductor substrate(1). A SixNyOz layer(3) is formed by nitridation processing of the gate oxide layer, and a polysilicon layer(4) is continuously deposited on the resultant structure. Desired dopants are implanted into the polysilicon layer. Oxidation or annealing process is performed to stabilize and activate the dopants.
|
申请公布号 |
KR100399957(B1) |
申请公布日期 |
2003.09.18 |
申请号 |
KR19960018366 |
申请日期 |
1996.05.28 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, BYEONG DAE;KIM, UI SIK |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|