发明名称 METHOD OF FORMING DIFFERENT SILICIDE PORTIONS ON DIFFERENT SILICON-CONTAINING REGIONS IN A SEMICONDUCTOR DEVICE
摘要 A method is disclosed in which different metal layers 240, 242 are sequentially deposited on silicon-containing regions so that the type and thickness of the metal layers 240, 242 may be adapted to specific characteristics of the underlying silicon-containing regions. Subsequently, a heat treatment is performed to convert the metals into metal silicides so as to improve the electrical conductivity of the silicon-containing regions. In this way, silicide portions 241, 243 may be formed that are individually adapted to specific silicon-containing regions so that device performance of individual semiconductor elements or the overall performance of a plurality of semiconductor elements may significantly be improved. Moreover, a semiconductor device is disclosed comprising at least two silicon-containing regions having formed therein differing silicide portions 241, 243, wherein at least one silicide portion comprises noble metal.
申请公布号 WO03075330(A1) 申请公布日期 2003.09.12
申请号 WO2002US41660 申请日期 2002.12.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 WIECZOREK, KARSTEN;HORSTMANN, MANFRED;STEPHAN, ROLF
分类号 H01L21/28;H01L21/285;H01L21/324;H01L21/336;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/49 主分类号 H01L21/28
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