发明名称 |
METHOD OF FORMING DIFFERENT SILICIDE PORTIONS ON DIFFERENT SILICON-CONTAINING REGIONS IN A SEMICONDUCTOR DEVICE |
摘要 |
A method is disclosed in which different metal layers 240, 242 are sequentially deposited on silicon-containing regions so that the type and thickness of the metal layers 240, 242 may be adapted to specific characteristics of the underlying silicon-containing regions. Subsequently, a heat treatment is performed to convert the metals into metal silicides so as to improve the electrical conductivity of the silicon-containing regions. In this way, silicide portions 241, 243 may be formed that are individually adapted to specific silicon-containing regions so that device performance of individual semiconductor elements or the overall performance of a plurality of semiconductor elements may significantly be improved. Moreover, a semiconductor device is disclosed comprising at least two silicon-containing regions having formed therein differing silicide portions 241, 243, wherein at least one silicide portion comprises noble metal. |
申请公布号 |
WO03075330(A1) |
申请公布日期 |
2003.09.12 |
申请号 |
WO2002US41660 |
申请日期 |
2002.12.20 |
申请人 |
ADVANCED MICRO DEVICES, INC. |
发明人 |
WIECZOREK, KARSTEN;HORSTMANN, MANFRED;STEPHAN, ROLF |
分类号 |
H01L21/28;H01L21/285;H01L21/324;H01L21/336;H01L21/8234;H01L21/8238;H01L27/088;H01L27/092;H01L29/49 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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