Focus measurement method in automatic focusing microscope, involves determining relation of current focus value with optimal focus value using intensity variation of electronic representation of object

摘要

An electronic representation of the object (14) to be studied, is produced. The variations in intensity of the electronic representation with the periphery of object is analyzed. The relation of application focus value indicating current focus position and the optimal focus position is determined using the intensity variation. Independent claims are also included for the following: (a) Focusing measurement; (b) Computer readable storage medium for analyzing electronic representation of object.