| 摘要 |
PROBLEM TO BE SOLVED: To provide a test facilitating circuit capable of reducing required cost for test of a semiconductor device. SOLUTION: A TIC 13 having a simple PG which is mounted on a mixed loading memory device is constituted of a command analysis part 21 which analyzes a 3 bits command received from a tester, outputs an analysis result to a memory core, and controls action of the memory core; and an address counter 22 which counts addresses and outputs the count to the memory core in accordance with a 2 bits counter control instruction received from the tester. Consequently, a circuit scale for testing of the memory core can be miniaturized and also the number of pins for testing of memory can be reduced, and an inexpensive tester can be used and the cost required for testing of the memory core can be reduced. COPYRIGHT: (C)2003,JPO
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