发明名称 EXHAUST-GAS UNIT FOR VACUUM CONTROL IN PROCESS CHAMBER
摘要 PROBLEM TO BE SOLVED: To provide an exhaust-gas unit for vacuum control in a process chamber capable of performing formation of an oxide film and formation of a nitrogen film as a continuous process even in an oxide film process, etc., with high integration and systematization of a semiconductor. SOLUTION: This exhaust-gas unit 1 for vacuum control in a process chamber provided with a proportional valve 100 for vacuum control with which an input control port 123 is connected to the process chamber, an output port 122 of the proportional valve 100 for vacuum control, and an ejector 200 connected to an input suction port 233 is an exhaust-gas unit for controlling vacuum in the process chamber. An output exhaust port 244 of the ejector 200 is connected to an exhaust duct. The output port 122 side of the proportional valve 100 for vacuum control is made into a vacuum with the ejector 200, and the valve opening of the proportional valve 100 for vacuum control is made variable for adjusting the exhaust velocity of the ejector 200. Thereby, the vacuum in the process chamber is controlled. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003202000(A) 申请公布日期 2003.07.18
申请号 JP20010401612 申请日期 2001.12.28
申请人 CKD CORP 发明人 KOKETSU MASAYUKI;MORI YOJI;KAGOHASHI HIROSHI;IKEO TOSHIHIRO
分类号 F16K51/02;B01J3/00;B01J3/02;F04F5/20;F04F5/48;F04F5/52;(IPC1-7):F04F5/20 主分类号 F16K51/02
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