发明名称 Measurement system having an improved scan list configuration
摘要 A digitizer for use in a measurement system. The digitizer acquires data from an external source, and includes a static random access memory (SRAM) which stores a scan list comprising entries specifying digitizer operations such as switch time, settle time, measure time, looping, and mathematical operation specifications such as scaling, adding, and averaging specifications. The looping specification may include instructions to repeatedly execute one or more entries in the scan list. The digitizer includes a programmable logic element (e.g. an FPGA) coupled to the SRAM which accesses and executes the scan list to acquire analog signals from the source. The digitizer may include an analog-to-digital converter to convert the analog signals to digital signals, as well as a multiplexer to read the analog signals from multiple channels, a signal conditioner to modify the analog signals from the multiplexer, and an amplifier to amplify the analog signals from the signal conditioner.
申请公布号 US6594612(B2) 申请公布日期 2003.07.15
申请号 US20000735234 申请日期 2000.12.11
申请人 NATIONAL INSTRUMENTS CORPORATION 发明人 MOCH ANDREW
分类号 G06F11/24;G06F19/00;(IPC1-7):G06F19/00 主分类号 G06F11/24
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