发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which setting to a test mode can be surely confirmed without increasing test terminals. SOLUTION: The semiconductor device 1 is provided with a normal mode, a plurality of test modes, and a setting confirming mode as an operation mode. A test mode signal generating circuit outputs a signal TMCE corresponding to the setting confirming mode in addition to test mode signals ZTM0-ZTMm corresponding respectively to a plurality of test modes. A comparing circuit compares signals X0-Xm outputted by a pre-decoder 24 when the signal TMCE is in an activation state with the test mode signals ZTM0-ZTMm, and outputs it to a DQ terminal through a data bus DB. It can be confirmed whether a test mode is set or not without increasing test terminals from which a test mode signal for confirmation is outputted. COPYRIGHT: (C)2003,JPO
申请公布号 JP2003197000(A) 申请公布日期 2003.07.11
申请号 JP20010396296 申请日期 2001.12.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 ITO KANJI;OTA AKIKO;YAMAI KEN;HIROSE MASAKAZU;OSHIKOSHI KIYOOMI
分类号 G01R31/28;G01R31/3183;G01R31/3185;G11C11/401;G11C29/00;G11C29/14;H01L21/66;(IPC1-7):G11C29/00;G01R31/318 主分类号 G01R31/28
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