发明名称 |
WAFER BOAT AND FURNACE AND METHOD FOR HEAT-TREATING WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide a wafer boat that prevents the slip of semiconductor wafers by reducing the contact stresses or deflections caused by the own weights of the wafers. SOLUTION: Prescribed heat treatment is performed on the semiconductor wafers W in a state where the wafers W are caused to generate Lorentz forces in the direction opposite to the gravitational force, by generating a magnetic field around the wafer boat 13 from the outside of a furnace core pipe 2 and making an electric current to flow to an electrode portion 24. COPYRIGHT: (C)2003,JPO
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申请公布号 |
JP2003197545(A) |
申请公布日期 |
2003.07.11 |
申请号 |
JP20010400423 |
申请日期 |
2001.12.28 |
申请人 |
TOSHIBA CORP;TOSHIBA CERAMICS CO LTD |
发明人 |
TERADA TAKAHIRO;OSANAI JUNICHI |
分类号 |
H01L21/22;H01L21/205;H01L21/324;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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