| 摘要 |
PROBLEM TO BE SOLVED: To improve the cost effect and the time efficiency for a test of an IC component in DUT. SOLUTION: The effective frequency of scanning motion is increased, and simultaneously the memory capacity can be increased by multiplexing two or more state data to each tester memory position 42, 44. A system 10 includes a source for providing the scan-in sequence 14 of the state data as the input simulation to test object devices DUT 18, and the scan-out sequence 16 of the predicted state data. A vector processor 30 receives the scan-in sequence 14 and the predicted scan-out sequence 16 to allow the exchange of the multiplexed state data. When a multiplexing coefficient is m, a device cycle rate can be multiplied by m-times of a tester cycle rate. The multiplexing coefficient is selected on the basis of the storage capacity of each tester memory position 42, 44, and the multiplication of an effective vector exchange rate by m-times of the tester cycle rate. COPYRIGHT: (C)2003,JPO
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