Simulation-test procedure for an integrated circuit

摘要

Test method makes use of a test vector comprising serial input values (SHIFTIN) and output values. Method has the following steps: placing of a circuit in serial mode at the start of clock cycle (CLK); positioning in parallel of serialized input values of the test vector at the selectors (S); parallel changing of the input values in the flip flops associated with the selectors; placing the circuit in normal mode; capture of the resulting values (SHIFTRES) from the flip flops; parallel collection of the result values and comparison with the serialized values from the output test vector.