发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to be capable of obtaining high dielectric constant and low leakage current by using a compound thin film of STO(Strontium Titanate Oxide) and Ta2O5. CONSTITUTION: A lower electrode is formed on a semiconductor substrate. An oxide thin film containing strontium, tantalum and titanium is formed on the lower electrode. A compound thin film consisting of STO(Strontium Titanate Oxide) and Ta2O5 is formed by annealing the oxide thin film containing strontium, tantalum and titanium. Then, an upper electrode is formed on the compound thin film of STO and Ta2O5.
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申请公布号 |
KR20030052636(A) |
申请公布日期 |
2003.06.27 |
申请号 |
KR20010082656 |
申请日期 |
2001.12.21 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHOI, EUN SEOK;YUM, SEUNG JIN |
分类号 |
H01L27/108;(IPC1-7):H01L27/108 |
主分类号 |
H01L27/108 |
代理机构 |
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地址 |
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