发明名称 Semiconductor chip for application in an integrated circuit generates a programming voltage on the chip while using a sensor/detector in a circuit to verify the creation of the voltage
摘要 A circuit structure has a metal oxide semiconductor transistor (1) or an XOR gate, with which a signal (S) is emitted to a control unit if a programming voltage (HV) is not correct. This makes it possible to recognize technical defects and to prevent deliberate attacks on the functionality of a chip. An Independent claim is also included for a circuit structure for verifying a programming voltage on an integrated circuit chip.
申请公布号 DE10160614(A1) 申请公布日期 2003.06.26
申请号 DE20011060614 申请日期 2001.12.11
申请人 INFINEON TECHNOLOGIES AG 发明人 JANKE, MARCUS;LIPPMANN, BERNHARD
分类号 G11C5/14;G11C16/22;(IPC1-7):H01L27/115;G11C16/12 主分类号 G11C5/14
代理机构 代理人
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