发明名称 |
Semiconductor chip for application in an integrated circuit generates a programming voltage on the chip while using a sensor/detector in a circuit to verify the creation of the voltage |
摘要 |
A circuit structure has a metal oxide semiconductor transistor (1) or an XOR gate, with which a signal (S) is emitted to a control unit if a programming voltage (HV) is not correct. This makes it possible to recognize technical defects and to prevent deliberate attacks on the functionality of a chip. An Independent claim is also included for a circuit structure for verifying a programming voltage on an integrated circuit chip.
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申请公布号 |
DE10160614(A1) |
申请公布日期 |
2003.06.26 |
申请号 |
DE20011060614 |
申请日期 |
2001.12.11 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
JANKE, MARCUS;LIPPMANN, BERNHARD |
分类号 |
G11C5/14;G11C16/22;(IPC1-7):H01L27/115;G11C16/12 |
主分类号 |
G11C5/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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