发明名称 |
Waveform measuring instrument using interpolated data |
摘要 |
The present invention is intended to provide a waveform measuring instrument which can carry out signal processing and waveform parameter measurement with high accuracy and at high resolution. In a waveform measuring instrument configured to write measured signal waveforms into a memory after converting the waveforms to digital data, the present invention is characterized by providing an interpolation system which performs interpolation between the above digital data and writing the data obtained after interpolation into the above memory.
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申请公布号 |
US2003115003(A1) |
申请公布日期 |
2003.06.19 |
申请号 |
US20020318196 |
申请日期 |
2002.12.13 |
申请人 |
YOKOGAWA ELECTRIC CORPORATION |
发明人 |
SAITOU TAKUYA;TAKEZAWA SHIGERU |
分类号 |
G01R13/02;G01R13/34;G06F19/00;(IPC1-7):G06F19/00 |
主分类号 |
G01R13/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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