发明名称 |
Warpage measurement system and methods |
摘要 |
A method for measuring the height variability of a stack of materials comprises placing a stack of materials onto a holder that comprises a base and at least two sides extending from the base such that the stack of materials rests on the base and is generally flush with the sides. A distance of a top of the stack of materials relative to a fixed plane is measured at various locations along the top of the stack of materials. The height variability of the stack is determined based on the measurements.
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申请公布号 |
US2003101608(A1) |
申请公布日期 |
2003.06.05 |
申请号 |
US20010001979 |
申请日期 |
2001.12.05 |
申请人 |
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发明人 |
MCCUNE ANDREW S.;YATES SANDRA S.;USSERY CLARENCE A.;FUENTES GIL V. |
分类号 |
B65H31/00;B65H43/00;G01B5/06;(IPC1-7):G01B5/25 |
主分类号 |
B65H31/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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