发明名称 |
THERMAL SHUT DOWN CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT |
摘要 |
PURPOSE: A thermal shut down circuit is provided to measure a chip temperature by arranging a temperature sensing transistor near to a power transistor and covering the power transistor by a metal. CONSTITUTION: At least one or more temperature sensing transistors(11) are installed in a semiconductor integrated circuit so as to be adjacent to thermal sources(31-36) such as power transistors. The temperature sensing transistors are installed corresponding to the power transistors. Alternatively, the temperature sensing transistors are installed between adjacent power transistors. The temperature sensing transistors are covered by a metal line which is contact with the thermal source.
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申请公布号 |
KR20030042942(A) |
申请公布日期 |
2003.06.02 |
申请号 |
KR20010073829 |
申请日期 |
2001.11.26 |
申请人 |
FAIRCHILD KOREA SEMICONDUCTOR LTD. |
发明人 |
CHOI, SSI CHEOL;LEE, JIN HUI;OH, WON HUI |
分类号 |
H02H5/04;(IPC1-7):H02H5/04 |
主分类号 |
H02H5/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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