发明名称 |
SCANNING ELECTRON MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a scanning electron microscope which can insert a sample in a spare room into an observation room without contaminating it by preventing organic gas molecules from flowing back to the spare room and thus can alleviate factors of contamination. SOLUTION: By arranging a gas guiding valve in the vicinity of a spare room and always guiding in very small amount of gas at evacuation, a flow of gas is created from a spare room side to an oil rotation pump side, whereby, backflow of organic gas molecules, a factor of contamination taking place at evacuation of the spare room can be prevented and organic gas molecules adhering to a sample can be curtailed.
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申请公布号 |
JP2003157786(A) |
申请公布日期 |
2003.05.30 |
申请号 |
JP20010353954 |
申请日期 |
2001.11.20 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP;HITACHI SCI SYST LTD |
发明人 |
ISHII RYOICHI;HAZAKI EIICHI;MUTO HIROSHI |
分类号 |
H01J37/18;(IPC1-7):H01J37/18 |
主分类号 |
H01J37/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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