发明名称 SCANNING ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a scanning electron microscope which can insert a sample in a spare room into an observation room without contaminating it by preventing organic gas molecules from flowing back to the spare room and thus can alleviate factors of contamination. SOLUTION: By arranging a gas guiding valve in the vicinity of a spare room and always guiding in very small amount of gas at evacuation, a flow of gas is created from a spare room side to an oil rotation pump side, whereby, backflow of organic gas molecules, a factor of contamination taking place at evacuation of the spare room can be prevented and organic gas molecules adhering to a sample can be curtailed.
申请公布号 JP2003157786(A) 申请公布日期 2003.05.30
申请号 JP20010353954 申请日期 2001.11.20
申请人 HITACHI HIGH-TECHNOLOGIES CORP;HITACHI SCI SYST LTD 发明人 ISHII RYOICHI;HAZAKI EIICHI;MUTO HIROSHI
分类号 H01J37/18;(IPC1-7):H01J37/18 主分类号 H01J37/18
代理机构 代理人
主权项
地址