| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor-testing apparatus for efficiently and easily increasing the number of devices to be tested simultaneously corresponding to the bit configuration of the I/O pin of the device to be tested when simultaneously testing the plurality of devices to be tested. SOLUTION: The semiconductor-testing apparatus for simultaneously testing a plurality of devices to be tested by providing a plurality of channel groups comprising a channel that is subjected to signal branching from the same signal source and allocating the channel of each channel group to the test pins comprises a first selection output means for selectively outputting the channel of an expectation value corresponding to the number of devices to be tested simultaneously, a logic comparison means for logically comparing selection output with the output of the device to be tested by the first selection means, and a second selection output means for selectively outputting the logic comparison result in the logic comparison means as a group of specific number of bits.
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