发明名称 FREQUENCY ANALYSIS DEVICE, FREQUENCY ANALYSIS METHOD, FREQUENCY ANALYSIS PROGRAM, TAPPING TEST DEVICE AND TAPPING TEST METHOD
摘要 PROBLEM TO BE SOLVED: To provide a frequency analysis technology capable of identifying a mode frequency highly accurately even in the case of short-time waveform data, while suppressing increase of the operation load. SOLUTION: When a sampled waveform data row is multiplied by a window function and a spectrum data row is generated by discrete Fourier series expansion such as FFT (fast Fourier transform) and the frequency of spectrum data with becomes the maximum value is identified as the mode frequency of a vibration phenomenon, a complex window function determined by multiplying a real window function by a complex phase term is used as the window function, and a cutout waveform data row having a shifted phase is generated by changing the value of the complex phase term, and the spectrum data row having a frequency origin shifted by the discrete Fourier series expansion such as FFT is additionally generated.
申请公布号 JP2003156480(A) 申请公布日期 2003.05.30
申请号 JP20010355058 申请日期 2001.11.20
申请人 TOYO SEIKAN KAISHA LTD 发明人 TAKENOUCHI TAKESHI
分类号 G01N29/12;G01M7/02;G10L11/00;(IPC1-7):G01N29/12 主分类号 G01N29/12
代理机构 代理人
主权项
地址