System and method for avoiding waiting repair analysis for semiconductor testing equipment

摘要

A system and a method for avoiding waiting repair analysis for a semiconductor testing equipment are disclosed. The semiconductor testing equipment directly executes next functional test after transferring previous test data regardless of if repair analysis is completed or not. A repair analysis apparatus has a pre-analysis storage device with a larger capacity than the test storage device of the semiconductor testing equipment for off-line repair analysis, so that the semiconductor test is efficiently improved.