发明名称 |
INFRARED MICROSCOPE, LASER DEFECT CORRECTING DEVICE WITH LASER USING THE SAME, AND METHOD OF OBSERVING LIQUID CRYSTAL PANEL |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a microscope and an observing method by which observation can be done without peeling off a polarizing plate with a retardation plate. SOLUTION: An infrared light source 2 for vertical lighting is used as a light source for vertical lighting of the microscope and an infrared high- sensitivity type CCD is used as a CCD for observation. This microscope makes it possible to observe an image of a part through the polarizing plate with the retardation plate that can not be observed through a microscope for visible light.</p> |
申请公布号 |
JP2003149558(A) |
申请公布日期 |
2003.05.21 |
申请号 |
JP20010348420 |
申请日期 |
2001.11.14 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
IMURA HIDEYUKI |
分类号 |
G01N21/84;B23K26/00;B23K101/42;G01N21/956;G02B21/00;G02B21/36;G02F1/13;(IPC1-7):G02B21/00 |
主分类号 |
G01N21/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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