发明名称 INFRARED MICROSCOPE, LASER DEFECT CORRECTING DEVICE WITH LASER USING THE SAME, AND METHOD OF OBSERVING LIQUID CRYSTAL PANEL
摘要 <p>PROBLEM TO BE SOLVED: To provide a microscope and an observing method by which observation can be done without peeling off a polarizing plate with a retardation plate. SOLUTION: An infrared light source 2 for vertical lighting is used as a light source for vertical lighting of the microscope and an infrared high- sensitivity type CCD is used as a CCD for observation. This microscope makes it possible to observe an image of a part through the polarizing plate with the retardation plate that can not be observed through a microscope for visible light.</p>
申请公布号 JP2003149558(A) 申请公布日期 2003.05.21
申请号 JP20010348420 申请日期 2001.11.14
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 IMURA HIDEYUKI
分类号 G01N21/84;B23K26/00;B23K101/42;G01N21/956;G02B21/00;G02B21/36;G02F1/13;(IPC1-7):G02B21/00 主分类号 G01N21/84
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