发明名称 Method of detecting crystalline defects using sound waves
摘要 Various methods of inspecting circuit structures are provided. In one aspect, a method of detecting structural defects in a circuit structure is provided. A natural frequency of the circuit structure is determined and the circuit structure is immersed in a liquid. A first plurality of sonic pulses is sent through the liquid. The first plurality of sonic pulses have a first frequency range selected to produce a plurality of collapsing bubbles proximate the circuit structure. The collapsing bubbles produce a second plurality of sonic pulses that have a second frequency range near or including the natural frequency of the circuit structure whereby the second plurality of sonic pulses causes the circuit structure to resonate. Thereafter, the circuit structure is inspected for structural damage. Early identification of crystalline defects is facilitated.
申请公布号 US6566886(B1) 申请公布日期 2003.05.20
申请号 US20010819785 申请日期 2001.03.28
申请人 ADVANCED MICRO DEVICES, INC. 发明人 COUTEAU TERRI A.;SATTERFIELD MICHAEL J.;PRESSLEY LAURA A.
分类号 G01N29/12;G01N29/28;G01N29/34;(IPC1-7):G01R31/08 主分类号 G01N29/12
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