发明名称 ELECTRONIC COMPONENT SUCKING DEVICE, AND ELECTRONIC COMPONENT TEST APPARATUS HAVING THE SUCKING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an electronic component sucking device which can improve the reliability of measurement of an electronic component by reliably bringing an electronic component terminal into contact with an electrode of a measurement tool, and an electronic component test apparatus. SOLUTION: The electronic component sucking device comprises a suction head having an opening part on a tip thereof and sucks the electronic component when the negative pressure is applied, a holding center bar 2 having a lead pipe part provided with a hole part to allow the gas to be fed/discharged through the opening part of the suction head and a holding part provided on the tip part to be inserted in the suction head, a coil spring 8 for applying the repulsive force between the suction head and the holding center bar, and a link lever 6 disposed between the suction head and the holding center bar. When the pressing force against the repulsive force of the coil spring 8 is applied to the holding center bar, the suction head is pushed upwardly by the link lever 6, and the holding part of the holding center bar is protruded from the suction head.
申请公布号 JP2003145471(A) 申请公布日期 2003.05.20
申请号 JP20010350504 申请日期 2001.11.15
申请人 FUJITSU MEDIA DEVICE KK 发明人 NAE AKIRA;OKUYAMA SHOICHI
分类号 G01R31/02;B25J15/00;B25J15/06;G01R31/01;H05K13/04;(IPC1-7):B25J15/06 主分类号 G01R31/02
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