发明名称 Method and apparatus for removing unwanted substance from semiconductor wafer
摘要 An apparatus for removing an unwanted substance from a semiconductor wafer, according to this invention, applies a peeling tape T to a protective tape P on the surface of the semiconductor wafer W. An edge member 28 is placed in contact with the surface of the peeling tape T and run along the protective tape P. The peeling tape T is peeled as being folded back by a large angle of 90 degrees or more at the tip of edge member 28. The protective tape P is peeled and removed along with the peeling tape T from the surface of the wafer. As a result, the unwanted substance is removed with high precision without breaking the wafer W.
申请公布号 US2003092288(A1) 申请公布日期 2003.05.15
申请号 US20020258792 申请日期 2002.10.28
申请人 YAMAMOTO MASAYUKI;AMETANI MINORU 发明人 YAMAMOTO MASAYUKI;AMETANI MINORU
分类号 H01L21/683;H01L21/00;H01L21/304;H01L21/687;(IPC1-7):H01L21/00 主分类号 H01L21/683
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