发明名称 Redundant comparator design for improved offset voltage and single event effects hardness
摘要 An analog comparator architecture has improved immunity to single event effects and variations in input offset voltage. A conventional single analog comparator-based circuit is replaced with plural comparators, driving a "majority vote" logic block. The effective input offset voltage of the multi-comparator design is the middle one of the individual comparators' input offset voltages. A single event upset on any comparator may momentarily perturb its output into the incorrect state; however, the output of the majority voting logic block will remain in the correct state, as only one comparator is upset. In addition, where a heavy ion strike on any comparator's bias current source causes a momentary loss of bias current, this upsets only one comparator, so that the output of the voting logic block is unaffected.
申请公布号 US6563347(B2) 申请公布日期 2003.05.13
申请号 US20010973106 申请日期 2001.10.09
申请人 INTERSIL AMERICAS INC. 发明人 DOYLE BRENT R.;SWONGER JAMES W.
分类号 H03K5/24;(IPC1-7):H03K5/22 主分类号 H03K5/24
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