发明名称 Ultra compact DRAM cell and method of making
摘要 A structure and method of manufacture is disclosed herein for a semiconductor memory cell having size of 4.5 F2 or less, where F is the minimum lithographic dimension. The semiconductor memory cell includes a storage capacitor formed in a trench, a transfer device formed in a substantially electrically isolated mesa region extending over a substantial arc of the outer perimeter of the trench, a buried strap which conductively connects the transfer device to the storage capacitor, wherein the transfer device has a controlled conduction channel located at a position of the arc removed from the buried strap.
申请公布号 US6552378(B1) 申请公布日期 2003.04.22
申请号 US19990385931 申请日期 1999.08.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION;INFINEON TECHNOLOGIES AG 发明人 HOENIGSCHMID HEINZ;HSU LOUIS LU-CHEN;MANDELMAN JACK ALLAN
分类号 H01L27/10;H01L21/8242;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/10
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