发明名称 Method for forming and patterning film
摘要 Metallic films are formed on a silicon substrate on which an insulation film and a conductive portion are exposed. The metallic films include a first metallic film directly contacting the insulation film and the conductive portion and a second metallic film disposed on the first metallic film as a stress adjustment film to control a stress at an interface between the first metallic film and the underlying member. Accordingly, an adhesion between the first metallic film and the insulation film can be controlled to be smaller than that between the first metallic film and the conductive portion. Then, the metallic film is removed from the insulation film by an adhesive sheet selectively while remaining on the conductive portion. As a result, the metallic film can be patterned stably and readily at low cost.
申请公布号 US6548386(B1) 申请公布日期 2003.04.15
申请号 US20000570038 申请日期 2000.05.12
申请人 DENSO CORPORATION 发明人 KONDO ICHIHARU;ISHIHARA YASUO;NAGAHAKA SHUICHI;MIYAJIMA TAKESHI
分类号 H01L21/60;H01L21/768;H01L23/485;(IPC1-7):H01L21/28;H01L21/44 主分类号 H01L21/60
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