| 摘要 |
The invention includes methods of forming magnetoresistive devices. In one method, a construction is formed which includes a first magnetic layer, a non-magnetic layer over the first magnetic layer, and a second magnetic layer over the non-magnetic layer. A first pattern is extended through the second magnetic layer and to the non-magnetic layer with an etch selective for the material of the second magnetic layer relative to the material of the non-magnetic layer. A dielectric material is formed over the patterned second magnetic layer, and subsequently a second etch is utilized to extend a second pattern through the non-magnetic layer and at least partway into the first magnetic layer.
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