High speed first pass yield report program and method

摘要

A method and software macro are disclosed for generating a first pass yield report, which may be employed in the manufacture and testing of semiconductor products. The method comprises obtaining raw data from a workstream database, executing a software macro in a computer system, and generating a first pass yield report comprising final yield data calculated via the macro. The macro may comprise computer-executable instructions for formatting the raw data, sorting the formatted data, and calculating final yield data by package type.