发明名称 Wafer polishing and endpoint detection
摘要 In a chem-mech polishing process for planarizing insulators such as silicon oxide and silicon nitride, a pool of slurry is utilized at a temperature between 85° F.-95° F. The slurry particulates (e.g. silica) have a hardness commensurate to the hardness of the insulator to be polished. Under these conditions, wafers can be polished at a high degree of uniformity more economically (by increasing pad lifetime), without introducing areas of locally incomplete polishing.
申请公布号 USRE38029(E1) 申请公布日期 2003.03.11
申请号 US19920852432 申请日期 1992.03.16
申请人 IBM CORPORATION 发明人 COTE WILLIAM J.;LEACH MICHAEL A.
分类号 B24B37/04;B24B49/16;H01L21/304;H01L21/3105;(IPC1-7):H01L21/00;C23F1/02 主分类号 B24B37/04
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