发明名称 Laser annealing apparatus and semiconductor device manufacturing method
摘要 This invention is intended to provide a laser annealing method by employing a laser annealer lower in running cost so as to deal with a large-sized substrate, for preventing or decreasing the generation of a concentric pattern and to provide a semiconductor device manufacturing method including a step using the laser annealing method. While moving a substrate at a constant rate between 20 and 200 cm/s, a laser beam is radiated aslant to a semiconductor film on a surface of the semiconductor substrate. Therefore, it is possible to radiate a uniform laser beam to even a semiconductor film on a large-sized substrate and to thereby manufacture a semiconductor device for which the generation of a concentric pattern is prevented or decreased. By condensing a plurality of laser beams into one flux, it is possible to prevent or decrease the generation of a concentric pattern and to thereby improve the reliability of the semiconductor device.
申请公布号 US2003038122(A1) 申请公布日期 2003.02.27
申请号 US20020212773 申请日期 2002.08.07
申请人 发明人 YAMAZAKI SHUNPEI;TANAKA KOICHIRO;HIROKI MASAAKI
分类号 H01L21/268;B23K26/08;C21D1/34;H01L21/20;H01L21/314;(IPC1-7):B23K26/00 主分类号 H01L21/268
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