发明名称 VOLTAGE-APPLIED CURRENT MEASURING APPARATUS AND SEMICONDUCTOR TESTER
摘要 PROBLEM TO BE SOLVED: To provide a voltage-applied current measuring apparatus realizable by a cheaper circuit arrangement and a semiconductor tester using the same. SOLUTION: The current-measuring apparatus has a floating type current measuring unit 300, having a floating form insulated from a circuit ground GND. The unit 300 is mainly composed of a floating power source, a current detecting resistance, a gain-regulating resistance, an operational amplifier(OPAMP), an DC converter, a series output unit and a photocoupler. The floating power source intended to feed circuits used for the measuring unit 300 with DC powers is an insulated DC power source floating from the circuit ground and is composed of, e.g., light-emitting elements and solar cells.
申请公布号 JP2003057270(A) 申请公布日期 2003.02.26
申请号 JP20010243404 申请日期 2001.08.10
申请人 ADVANTEST CORP 发明人 SATO TADASUKE
分类号 G01R31/26;G01R19/165;G01R31/28;(IPC1-7):G01R19/165 主分类号 G01R31/26
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