发明名称 METHOD FOR DETECTING PATTERN BLOCKS IN MACHINE VISION
摘要 PURPOSE: A method for detecting pattern blocks in a machine vision is provided to accurately and stably discriminate examination pattern blocks through gradient graphs in consecutive examination. CONSTITUTION: A method for detecting pattern blocks in a machine vision includes the steps of obtaining image information of the whole standard examination substance(S501); generating a gradient graph by each scan line(S503); setting a specific part for determining a one block by referring to the gradient graphs(S505); calculating distance from the corresponding specific part to both ends of an examination pattern block(S507); storing the calculation result of the image information of the graph corresponding to the specific part(S509); line-scanning an examination substance(S601); operating the sum of bright deviation of a plurality of cells, and obtaining a gradient graph of each scan line(S603); comparing the gradient graph of the present line scan with the stored gradient graph of the standard examination substance(S605); and obtaining a start point and an end point of the examination pattern block of the gradient graph of the present line scan(S607).
申请公布号 KR20030012004(A) 申请公布日期 2003.02.12
申请号 KR20010045832 申请日期 2001.07.30
申请人 ADVANCED TECHNOLOGY INC. 发明人 KIM, SEON UK;LEE, GYU DONG
分类号 G01B11/25;(IPC1-7):G01B11/25 主分类号 G01B11/25
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