发明名称 |
METHOD FOR DETECTING PATTERN BLOCKS IN MACHINE VISION |
摘要 |
PURPOSE: A method for detecting pattern blocks in a machine vision is provided to accurately and stably discriminate examination pattern blocks through gradient graphs in consecutive examination. CONSTITUTION: A method for detecting pattern blocks in a machine vision includes the steps of obtaining image information of the whole standard examination substance(S501); generating a gradient graph by each scan line(S503); setting a specific part for determining a one block by referring to the gradient graphs(S505); calculating distance from the corresponding specific part to both ends of an examination pattern block(S507); storing the calculation result of the image information of the graph corresponding to the specific part(S509); line-scanning an examination substance(S601); operating the sum of bright deviation of a plurality of cells, and obtaining a gradient graph of each scan line(S603); comparing the gradient graph of the present line scan with the stored gradient graph of the standard examination substance(S605); and obtaining a start point and an end point of the examination pattern block of the gradient graph of the present line scan(S607).
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申请公布号 |
KR20030012004(A) |
申请公布日期 |
2003.02.12 |
申请号 |
KR20010045832 |
申请日期 |
2001.07.30 |
申请人 |
ADVANCED TECHNOLOGY INC. |
发明人 |
KIM, SEON UK;LEE, GYU DONG |
分类号 |
G01B11/25;(IPC1-7):G01B11/25 |
主分类号 |
G01B11/25 |
代理机构 |
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主权项 |
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地址 |
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