发明名称 A control gate decoder for twin MONOS memory with two bit erase capability
摘要 <p>The present invention is a decoder for control gate lines of a twin MONOS flash memory array. Decoder units connected to each control gate line of the memory are controlled to provide select, override and unselect voltages to perform read, program and erase operations. The decoder units are divided into odd and even addressing where separate voltages can be applied control gates of to adjacent memory cells. Override voltages, which prevent operations of a selected cell from affecting adjacent memory cell storage sites, can be applied to the control gates of immediate neighboring cells of the selected sell. Unselected voltages can be applied to beyond the immediate neighboring cells to further prevent disturb conditions in remote cells. &lt;IMAGE&gt;</p>
申请公布号 EP1274093(A2) 申请公布日期 2003.01.08
申请号 EP20020368070 申请日期 2002.07.05
申请人 HALO LSI DESIGN AND DEVICE TECHNOLOGY INC. 发明人 OGURA, TOMOKO;OGURA, NORI
分类号 G11C16/06;G11C16/02;G11C16/04;G11C16/08;G11C16/16;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04;G11C16/22 主分类号 G11C16/06
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