发明名称 |
Method and device for testing electronic components |
摘要 |
A method for testing electronic components includes the step of outputting test output data for the tested electronic components on a test board without activating individual scan lines or individual scan signals. Starting from a first activated electronic component successively the following electronic components are activated one after another by passing an activation signal from electronic component to electronic component. A device for testing electronic components is also provided.
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申请公布号 |
US6504359(B2) |
申请公布日期 |
2003.01.07 |
申请号 |
US20010768393 |
申请日期 |
2001.01.24 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
POLNEY JENS |
分类号 |
G01R31/319;G01R31/3193;(IPC1-7):G01R31/26;G01R31/28 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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