发明名称 COUNTER FOR ACCUMULATED LAYER IN CHEMICAL VAPOR DEPOSITION FACILITY
摘要 PURPOSE: A counter for accumulated layer in CVD(Chemical Vapor Deposition) facility is provided to facilitate and stabilize the management of accumulated layer by evaluating and displaying the total quantity of reaction gas supplied and improve production yield by fixing in time. CONSTITUTION: A counter(100) includes a MFC sensing unit(110), a valve sensing unit(120), an evaluation unit(130) and a display unit(140). The MFC sensing unit installed in the pipeline for reaction gas outputs electric signal proportional to the quantity of gas flow predetermined by MFC controller. The gap of a control valve inside the unit is adjusted depending on the predetermined value. The valve sensing unit outputs electric signal sensing the opening time of the valve. The evaluation unit evaluates the total accumulated quantity of reaction gas supplied, multiplying the quantity of gas flow by the opening time of the valve, which is shown on the display unit.
申请公布号 KR20030000432(A) 申请公布日期 2003.01.06
申请号 KR20010036202 申请日期 2001.06.25
申请人 ANAM SEMICONDUCTOR., LTD. 发明人 CHO, IN SEOK
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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