| 摘要 |
PROBLEM TO BE SOLVED: To solve the problems of increase in the number of clocks, increase in external terminals, etc., needed for TAP controller control and data setting when a processor is debugged. SOLUTION: In a semiconductor integrated circuit including a plurality of processors, increase in external terminals and the number of clocks is prevented and a fast on-chip debugging can be realized by diverting a TRST terminal of a JTAG test access port as a select terminal of a selector circuit, inserting an inverter between the TRST terminal and one processor to be a selector function, using a first control circuit including a counter and a decoder instead of the selector circuit and using a TMS terminal instead of the TRST terminal to be a second control circuit. |
