| 摘要 |
<p>A multi−layer film spectroscopic element sufficiently high in reflection intensity of the B−Kαline for boron X−ray fluorescent analysis conducted in a short time with high accuracy while sufficiently reducing the effect of the interfering line and background.In the multi−layer spectroscopic element(3),a reflection layer(31)is formed of lanthanum(La),an alloy mainly consisting of lanthanum,or a lanthanum oxide(La<sb>2</sb>O<sb>3</sb>),a spacer layer(32)is formed of boron(B),the periodic length(d)is 7−14 nm,and the film thickness ratio of the reflection layer(31)to the spacer layer(32)is 2/3 to 3/2.The element has a total film thickness(t)such that the reflection intensity of the B−Kαline is not less than 98% of the saturation value.</p> |
