发明名称 |
METHOD FOR MANUFACTURING STACKED FLASH MEMORY CELL |
摘要 |
PURPOSE: A method for manufacturing a stacked flash memory cell is provided to prevent a shift of threshold voltage of memory cells by enhancing a charge retention capability of a floating gate. CONSTITUTION: A gate oxide layer is formed on an active region of a semiconductor substrate(200). A structure sequentially stacked a floating gate, a dielectric film of ONO structure and a control gate are sequentially formed on a desired portion of the gate oxide(210-230). An oxide layer made of SiON is formed on the gate oxide layer including the stacked structure by an oxidation processing using N2O gas or NO gas as a source gas(240). An LDD(Lightly Doped Drain) region is formed in the substrate(250). After forming an insulating spacer at both sidewalls of the stacked structure(260), source and drain regions are formed(270).
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申请公布号 |
KR20020094222(A) |
申请公布日期 |
2002.12.18 |
申请号 |
KR20010031073 |
申请日期 |
2001.06.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, BYEONG DONG;KIM, MAN SU;PARK, YEON SIK;RYU, GYU BOK;SHIN, CHUNG HWAN |
分类号 |
H01L21/8247;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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