发明名称 ION DOPING EQUIPMENT AND CONTROL METHOD OF DOSING AMOUNT TO BE USED FOR SAME
摘要 PROBLEM TO BE SOLVED: To provide an ion doping equipment with which ion amount of required impurities can be precisely controlled at ion doping process. SOLUTION: A fixed faraday to measure dosing amount is arranged on the periphery of a glass substrate of a susceptor retaining the substrate. It is so designed that a dosing amount of required impurities can be precisely measured during ion-doping treatment by attaching to the fixed faraday an electromagnet or a permanent magnet which enables separation of mass.
申请公布号 JP2002358921(A) 申请公布日期 2002.12.13
申请号 JP20010162299 申请日期 2001.05.30
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 ISHIKAWA KATSUYA
分类号 H01J37/09;H01J37/317;H01L21/265;(IPC1-7):H01J37/317 主分类号 H01J37/09
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