发明名称 |
ION DOPING EQUIPMENT AND CONTROL METHOD OF DOSING AMOUNT TO BE USED FOR SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide an ion doping equipment with which ion amount of required impurities can be precisely controlled at ion doping process. SOLUTION: A fixed faraday to measure dosing amount is arranged on the periphery of a glass substrate of a susceptor retaining the substrate. It is so designed that a dosing amount of required impurities can be precisely measured during ion-doping treatment by attaching to the fixed faraday an electromagnet or a permanent magnet which enables separation of mass.
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申请公布号 |
JP2002358921(A) |
申请公布日期 |
2002.12.13 |
申请号 |
JP20010162299 |
申请日期 |
2001.05.30 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
ISHIKAWA KATSUYA |
分类号 |
H01J37/09;H01J37/317;H01L21/265;(IPC1-7):H01J37/317 |
主分类号 |
H01J37/09 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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