发明名称 |
METHOD FOR REMOVING TITANIUM-BASED CONTAMINATIVE LAYER DEPOSITED ON BASIC MATERIAL OF TITANIUM COLLIMATOR BY USING SACRIFICIAL LAYER |
摘要 |
PURPOSE: A method for removing a titanium-based contaminative layer deposited on a basic material of a titanium collimator by using a sacrificial layer is provided to remove selectively titanium and titanium nitride without a damage of the basic material by coating a sacrificial layer on a collimator and etching selectively only the sacrificial layer. CONSTITUTION: Titanium and titanium nitride(1) are deposited on a collimator. A sacrificial layer(2) is used for performing an etching process. The sacrificial layer(2) is not separated easily from a basic material(3) of a collimator by an external physical variation and an external thermal variation since the sacrificial layer(2) has an excellent adhesive strength and a low thermal expansion coefficient. The collimator is coated without generating an outgassing phenomenon since the collimator is used under a state of high vacuum. The collimator has thickness enough for removing the titanium and the titanium nitride(1).
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申请公布号 |
KR20020091336(A) |
申请公布日期 |
2002.12.06 |
申请号 |
KR20010029887 |
申请日期 |
2001.05.30 |
申请人 |
KOMI CO., LTD. |
发明人 |
CHUN, HUI GON |
分类号 |
H01L21/20;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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地址 |
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