| 摘要 |
PROBLEM TO BE SOLVED: To increase the X-ray dosage of diffracted X-rays detected by an X-ray detector, and to shorten a measuring time. SOLUTION: This X-ray stress measuring device 1 increases the X-ray dosage of the diffracted X-rays detected by the X-ray detector and shortens the measuring time, by increasing the X-ray dosage radiated to a sample from an X-ray source and increasing the X-ray dosage of the diffracted X-rays reaching an X-ray detection means. The device comprises a constitution equipped with an X-ray collimating means 3 for collimating X-rays emitted from the X-ray source 2 and irradiating the sample therewith, an X-ray detection means 4 including plural X-ray detection elements for detecting the diffracted X-rays emitted from the sample S, and an X-ray reflecting and condensing means 5 for reflecting the diffracted X-rays emitted from the sample and condensing the X-rays onto the X-ray detection means 4 on the focal position. Thus, the X-ray dosage is increased, and measured on the condensing position of the diffracted X-rays on the X-ray detection means 4, to thereby measure the stress.
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