HIGH-FREQUENCY ELECTRICAL SIGNAL SAMPLING DEVICE

摘要

The invention relates to a device for sampling a high-frequency signal propagating in a propagating structure. The inventive device comprises a first stage (A1, I1, C1), which is used to take a first signal sample at a first instant t1, and at least one second stage (A2, I2, C2), which is in series with the first stage and which is used to take a second sample from the first sample at a second instant t2 that is greater than t1, said second sample being representative of the first sample and having a lifetime greater than that of the first sample. The invention applies to pulse metrology among other uses.